Statistical metrology and process control of quantum devices
Thesis: Ph. D., Massachusetts Institute of Technology, Department of Electrical Engineering and Computer Science, May, 2020 === Cataloged from the official PDF of thesis. === Includes bibliographical references (pages 169-187). === Quantum emitters, such as color centers (e.g., nitrogen-vacancy colo...
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| Format: | Others |
| Language: | English |
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Massachusetts Institute of Technology
2020
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| Online Access: | https://hdl.handle.net/1721.1/126998 |