Analysis of polysilicon critical dimension variation for submicron CMOS processes

Thesis (M.S.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1994. === Includes bibliographical references (p. 139-140). === by Dawn Dougherty Fitzgerald. === M.S.

Bibliographic Details
Main Author: Fitzgerald, Dawn Dougherty
Other Authors: Duane Boning, Charles Fine.
Format: Others
Language:English
Published: Massachusetts Institute of Technology 2005
Subjects:
Online Access:http://hdl.handle.net/1721.1/12028