Standard operating procedure for Highly Accelerated Life Testing (HALT) : design and standardization of fixture setup for circuit boards

Thesis: M. Eng. in Manufacturing, Massachusetts Institute of Technology, Department of Mechanical Engineering, 2016. === Cataloged from PDF version of thesis. === Includes bibliographical references (pages 153-156). === This thesis deals with the introduction of Highly Accelerated Life Testing (HALT...

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Bibliographic Details
Main Author: Chew, Dexter Xuan Han
Other Authors: David E. Hardt and Duane S. Boning.
Format: Others
Language:English
Published: Massachusetts Institute of Technology 2017
Subjects:
Online Access:http://hdl.handle.net/1721.1/106765