Electrostatic force sampling of digital waveforms usin synchronous time domain gating
Non-invasive internal testing of high speed microelectronics is essential for failure analysis and design verifications. This thesis presents electrostatic force sampling of high speed digital waveforms with the method of synchronous time domain gating to overcome the inherent bandwidth limitation....
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| Language: | en_US |
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2007
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| Online Access: | http://hdl.handle.net/1993/2242 |