Iddq Testing of a CMOS 10-Bit Charge Scaling Digital-to-Analog Converter
This work presents an effective built-in current sensor (BICS), which has a very small impact on the performance of the circuit under test (CUT). The proposed BICS works in two-modes the normal mode and the test mode. In the normal mode the BICS is isolated from the CUT due to which there is no perf...
| Main Author: | |
|---|---|
| Other Authors: | |
| Format: | Others |
| Language: | en |
| Published: |
LSU
2003
|
| Subjects: | |
| Online Access: | http://etd.lsu.edu/docs/available/etd-1031103-133101/ |