Effects of sample treatment on mixed-layer illite-smectite in X-ray diffractograms and transmission electron micrographs

Combined X-ray powder diffraction (XRD) and high-resolution transmission electron microscopy (HRTEM) were used to identify and characterize the clay mineral assemblages in 0.05-0.1 $ mu$m and ${<0.05} mu$m size fractions separated from shales of three depths (4800, 8700-8750, and 12500-12550 ft)...

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Bibliographic Details
Main Author: Sears, S. Kelly (Stephen Kelly)
Other Authors: Hesse, Reinhard (advisor)
Format: Others
Language:en
Published: McGill University 1993
Subjects:
Online Access:http://digitool.Library.McGill.CA:80/R/?func=dbin-jump-full&object_id=69658