Electrical Properties of Grain Boundaries in Low Doped Polycrystalline Materials with Applications to Detectors

Electrical Properties of Grain Boundaries in Low Doped Polycrystalline Materials with Applications to Detectors

Polycrystalline materials are widely used in large area electronic devices such as flat panel x-ray image detectors, and solar cells due to their suitability to deposit over large area at low cost. The performance of polycrystalline-based flat panel detectors are showing encouraging results (good se...

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Bibliographic Details
Main Author: Chowdhury, Mazharul Huq
Format: Others
Published: 2010
Online Access:http://spectrum.library.concordia.ca/7486/1/Chowdhury_MASc_S2011.pdf
Chowdhury, Mazharul Huq <http://spectrum.library.concordia.ca/view/creators/Chowdhury=3AMazharul_Huq=3A=3A.html> (2010) Electrical Properties of Grain Boundaries in Low Doped Polycrystalline Materials with Applications to Detectors. Masters thesis, Concordia University.

Internet

http://spectrum.library.concordia.ca/7486/1/Chowdhury_MASc_S2011.pdf
Chowdhury, Mazharul Huq <http://spectrum.library.concordia.ca/view/creators/Chowdhury=3AMazharul_Huq=3A=3A.html> (2010) Electrical Properties of Grain Boundaries in Low Doped Polycrystalline Materials with Applications to Detectors. Masters thesis, Concordia University.

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