Depth perception from defocus : a neural network based approach for automated visual inspection in VLSI wafer probing
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| Format: | Others |
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1992
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| Online Access: | http://spectrum.library.concordia.ca/2918/1/MM73684.pdf Khan, Neyaz <http://spectrum.library.concordia.ca/view/creators/Khan=3ANeyaz=3A=3A.html> (1992) Depth perception from defocus : a neural network based approach for automated visual inspection in VLSI wafer probing. Masters thesis, Concordia University. |
Internet
http://spectrum.library.concordia.ca/2918/1/MM73684.pdfKhan, Neyaz <http://spectrum.library.concordia.ca/view/creators/Khan=3ANeyaz=3A=3A.html> (1992) Depth perception from defocus : a neural network based approach for automated visual inspection in VLSI wafer probing. Masters thesis, Concordia University.