Concurrent Error Detection in Finite Field Arithmetic Operations
With significant advances in wired and wireless technologies and also increased shrinking in the size of VLSI circuits, many devices have become very large because they need to contain several large units. This large number of gates and in turn large number of transistors causes the devices to be mo...
| Main Author: | |
|---|---|
| Language: | en |
| Published: |
2008
|
| Subjects: | |
| Online Access: | http://hdl.handle.net/10012/3460 |