Electromigration Reliability Analysis of Power Delivery Networks in Integrated Circuits
Electromigration in metal lines has re-emerged as a significant concern in modern VLSI circuits. The higher levels of temperature and the large number of EM checking strategies, have led to a situation where trying to guarantee EM reliability often leads to conservative designs that may not meet the...
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| Language: | en_ca |
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2013
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| Online Access: | http://hdl.handle.net/1807/42835 |