Nanoscale Chemical Imaging of Synthetic and Biological Materials using Apertureless Near-field Scanning Infrared Microscopy
Apertureless near-field scanning infrared microscopy is a technique in which an impinging infrared beam is scattered by a sharp atomic force microscopy (AFM) tip oscillating at the resonant frequency of the cantilever in close proximity to a sample. Several advantages offered by near-field imaging i...
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| Language: | en_ca |
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2012
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| Online Access: | http://hdl.handle.net/1807/34838 |