System-Level Power, Thermal and Reliability Optimization

An integrated circuit can now contain more than one billion transistors. With increasing system integration and technology scaling, power and power-related issues have become the primary challenges of integrated circuit design. In this dissertation, techniques and algorithms, from system-level synth...

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Main Author: Zhu, CHANGYUN
Other Authors: Queen's University (Kingston, Ont.). Theses (Queen's University (Kingston, Ont.))
Format: Others
Language:en
en
Published: 2009
Subjects:
Online Access:http://hdl.handle.net/1974/1979
id ndltd-LACETR-oai-collectionscanada.gc.ca-OKQ.1974-1979
record_format oai_dc
spelling ndltd-LACETR-oai-collectionscanada.gc.ca-OKQ.1974-19792013-12-20T03:39:29ZSystem-Level Power, Thermal and Reliability OptimizationZhu, CHANGYUNPowerThermalReliabilityAn integrated circuit can now contain more than one billion transistors. With increasing system integration and technology scaling, power and power-related issues have become the primary challenges of integrated circuit design. In this dissertation, techniques and algorithms, from system-level synthesis to emerging integration and device technologies, are proposed to address the power and power-induced thermal and reliability challenges of modern billion-transistor integrated circuit design. In Chapter 1, the challenges of semiconductor technology scaling are introduced. Chapter 2 reviews the related works. Chapter 3 focuses on the reliability optimization issue during system-level design. A reliable application-specic multiprocessor system-on-chip synthesis system is proposed, called TASR, which exploits redundancy and thermal-aware design planning to produce reliable and compact circuit designs. Chapter 4 introduces three-dimensional (3D) integration, a new integrated circuit fabrication and integration technology. Thermal issue is a primary concern of 3D integration. A 3D integrated circuit heat flow analytical framework is proposed in this chapter. Proactive, continuously-engaged hardware and operating system thermal management techniques are presented and evaluated which optimize system performance than state-of-the-art techniques while honoring the same temperature bound. Chapter 5 presents reconfigurable architecture design using single-electron tunneling transistor, an ultra-low-power nanometer-scale device. The proposed design has the potential to overcome the power and energy barriers for both high-performance computing and ultra-low-power embedded systems. Conclusions are drawn in Chapter 6.Thesis (Ph.D, Electrical & Computer Engineering) -- Queen's University, 2009-07-02 19:24:18.632Queen's University (Kingston, Ont.). Theses (Queen's University (Kingston, Ont.))2009-07-02 19:24:18.6322009-07-03T18:43:04Z2009-07-03T18:43:04Z2009-07-03T18:43:04ZThesis1439088 bytesapplication/pdfhttp://hdl.handle.net/1974/1979enenCanadian thesesThis publication is made available by the authority of the copyright owner solely for the purpose of private study and research and may not be copied or reproduced except as permitted by the copyright laws without written authority from the copyright owner.
collection NDLTD
language en
en
format Others
sources NDLTD
topic Power
Thermal
Reliability
spellingShingle Power
Thermal
Reliability
Zhu, CHANGYUN
System-Level Power, Thermal and Reliability Optimization
description An integrated circuit can now contain more than one billion transistors. With increasing system integration and technology scaling, power and power-related issues have become the primary challenges of integrated circuit design. In this dissertation, techniques and algorithms, from system-level synthesis to emerging integration and device technologies, are proposed to address the power and power-induced thermal and reliability challenges of modern billion-transistor integrated circuit design. In Chapter 1, the challenges of semiconductor technology scaling are introduced. Chapter 2 reviews the related works. Chapter 3 focuses on the reliability optimization issue during system-level design. A reliable application-specic multiprocessor system-on-chip synthesis system is proposed, called TASR, which exploits redundancy and thermal-aware design planning to produce reliable and compact circuit designs. Chapter 4 introduces three-dimensional (3D) integration, a new integrated circuit fabrication and integration technology. Thermal issue is a primary concern of 3D integration. A 3D integrated circuit heat flow analytical framework is proposed in this chapter. Proactive, continuously-engaged hardware and operating system thermal management techniques are presented and evaluated which optimize system performance than state-of-the-art techniques while honoring the same temperature bound. Chapter 5 presents reconfigurable architecture design using single-electron tunneling transistor, an ultra-low-power nanometer-scale device. The proposed design has the potential to overcome the power and energy barriers for both high-performance computing and ultra-low-power embedded systems. Conclusions are drawn in Chapter 6. === Thesis (Ph.D, Electrical & Computer Engineering) -- Queen's University, 2009-07-02 19:24:18.632
author2 Queen's University (Kingston, Ont.). Theses (Queen's University (Kingston, Ont.))
author_facet Queen's University (Kingston, Ont.). Theses (Queen's University (Kingston, Ont.))
Zhu, CHANGYUN
author Zhu, CHANGYUN
author_sort Zhu, CHANGYUN
title System-Level Power, Thermal and Reliability Optimization
title_short System-Level Power, Thermal and Reliability Optimization
title_full System-Level Power, Thermal and Reliability Optimization
title_fullStr System-Level Power, Thermal and Reliability Optimization
title_full_unstemmed System-Level Power, Thermal and Reliability Optimization
title_sort system-level power, thermal and reliability optimization
publishDate 2009
url http://hdl.handle.net/1974/1979
work_keys_str_mv AT zhuchangyun systemlevelpowerthermalandreliabilityoptimization
_version_ 1716621011794788352