System-Level Power, Thermal and Reliability Optimization

An integrated circuit can now contain more than one billion transistors. With increasing system integration and technology scaling, power and power-related issues have become the primary challenges of integrated circuit design. In this dissertation, techniques and algorithms, from system-level synth...

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Bibliographic Details
Main Author: Zhu, CHANGYUN
Other Authors: Queen's University (Kingston, Ont.). Theses (Queen's University (Kingston, Ont.))
Format: Others
Language:en
en
Published: 2009
Subjects:
Online Access:http://hdl.handle.net/1974/1979