Internal signal sampling of high-speed integrated circuits using dynamic electrostatic force and force-gradient microscopy

Bibliographic Details
Main Author: Weng, Terry (Zhinong)
Published: 2013
Online Access:http://hdl.handle.net/1993/20826
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spelling ndltd-LACETR-oai-collectionscanada.gc.ca-MWU.1993-208262014-03-29T03:47:50Z Internal signal sampling of high-speed integrated circuits using dynamic electrostatic force and force-gradient microscopy Weng, Terry (Zhinong) 2013-05-17T18:11:29Z 2013-05-17T18:11:29Z 2005 http://hdl.handle.net/1993/20826
collection NDLTD
sources NDLTD
description
author Weng, Terry (Zhinong)
spellingShingle Weng, Terry (Zhinong)
Internal signal sampling of high-speed integrated circuits using dynamic electrostatic force and force-gradient microscopy
author_facet Weng, Terry (Zhinong)
author_sort Weng, Terry (Zhinong)
title Internal signal sampling of high-speed integrated circuits using dynamic electrostatic force and force-gradient microscopy
title_short Internal signal sampling of high-speed integrated circuits using dynamic electrostatic force and force-gradient microscopy
title_full Internal signal sampling of high-speed integrated circuits using dynamic electrostatic force and force-gradient microscopy
title_fullStr Internal signal sampling of high-speed integrated circuits using dynamic electrostatic force and force-gradient microscopy
title_full_unstemmed Internal signal sampling of high-speed integrated circuits using dynamic electrostatic force and force-gradient microscopy
title_sort internal signal sampling of high-speed integrated circuits using dynamic electrostatic force and force-gradient microscopy
publishDate 2013
url http://hdl.handle.net/1993/20826
work_keys_str_mv AT wengterryzhinong internalsignalsamplingofhighspeedintegratedcircuitsusingdynamicelectrostaticforceandforcegradientmicroscopy
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