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ndltd-LACETR-oai-collectionscanada.gc.ca-MWU.1993-20826
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ndltd-LACETR-oai-collectionscanada.gc.ca-MWU.1993-208262014-03-29T03:47:50Z Internal signal sampling of high-speed integrated circuits using dynamic electrostatic force and force-gradient microscopy Weng, Terry (Zhinong) 2013-05-17T18:11:29Z 2013-05-17T18:11:29Z 2005 http://hdl.handle.net/1993/20826
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NDLTD
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NDLTD
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description |
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author |
Weng, Terry (Zhinong)
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spellingShingle |
Weng, Terry (Zhinong)
Internal signal sampling of high-speed integrated circuits using dynamic electrostatic force and force-gradient microscopy
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author_facet |
Weng, Terry (Zhinong)
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author_sort |
Weng, Terry (Zhinong)
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title |
Internal signal sampling of high-speed integrated circuits using dynamic electrostatic force and force-gradient microscopy
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title_short |
Internal signal sampling of high-speed integrated circuits using dynamic electrostatic force and force-gradient microscopy
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title_full |
Internal signal sampling of high-speed integrated circuits using dynamic electrostatic force and force-gradient microscopy
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title_fullStr |
Internal signal sampling of high-speed integrated circuits using dynamic electrostatic force and force-gradient microscopy
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title_full_unstemmed |
Internal signal sampling of high-speed integrated circuits using dynamic electrostatic force and force-gradient microscopy
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title_sort |
internal signal sampling of high-speed integrated circuits using dynamic electrostatic force and force-gradient microscopy
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publishDate |
2013
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url |
http://hdl.handle.net/1993/20826
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work_keys_str_mv |
AT wengterryzhinong internalsignalsamplingofhighspeedintegratedcircuitsusingdynamicelectrostaticforceandforcegradientmicroscopy
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_version_ |
1716662011531624448
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