Internal signal sampling of high-speed integrated circuits using dynamic electrostatic force and force-gradient microscopy

Internal signal sampling of high-speed integrated circuits using dynamic electrostatic force and force-gradient microscopy

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Bibliographic Details
Main Author: Weng, Terry (Zhinong)
Published: 2013
Online Access:http://hdl.handle.net/1993/20826

Internet

http://hdl.handle.net/1993/20826

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