Non-invasive internal pattern extraction of integrated circuits using electrostatic force microscopy
Improvements in technology of the microelectronic areas have allowed researchers to develop Integrated Circuits (ICs) with higher speed and smaller size. However these improvements have also increased the difficulties for diagnostic testing of the circuits in the radio frequency (RF) range. The ide...
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| Language: | en_US |
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2007
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| Online Access: | http://hdl.handle.net/1993/1740 |