Fault characterization and testing of digital current mode logic circuits
The research reported in this dissertation describes a new approach to test differential current- mode logic (CML) circuits. The tests described in this thesis have been developed for high-speed digital interface circuits, such as multiplexors and demultiplexers, used in the telecom/ datacom indu...
| Main Author: | |
|---|---|
| Language: | English |
| Published: |
2009
|
| Online Access: | http://hdl.handle.net/2429/9212 |