On multiple intermediate signature analysis for built-in self-test
Built-in Self-Test (BIST) is becoming a widely accepted means for testing VLSI circuits. BIST usually consists of two major functions known as on chip test pattern generation and test response evaluation. There are two major difficulties regarding test response evaluation. The first is reducing t...
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| Language: | English |
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2009
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| Online Access: | http://hdl.handle.net/2429/6909 |