On power-supply current testing of mixed-signal phase-locked-loops

On power-supply current testing of mixed-signal phase-locked-loops

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Due to rapid advances in the speed and complexity of VLSI circuits, analog and mixed-signal circuits are going through a resurgence. Today, the state-of-the-art of the analog and mixed-signal integrated circuit testing is to use application-specific test techniques for individual modules. Efforts...

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Bibliographic Details
Main Author:	Dalmia, Maneesha
Language:	English
Published:	2009
Online Access:	http://hdl.handle.net/2429/6385

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