On power-supply current testing of mixed-signal phase-locked-loops
Due to rapid advances in the speed and complexity of VLSI circuits, analog and mixed-signal circuits are going through a resurgence. Today, the state-of-the-art of the analog and mixed-signal integrated circuit testing is to use application-specific test techniques for individual modules. Efforts...
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| Language: | English |
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2009
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| Online Access: | http://hdl.handle.net/2429/6385 |