Analysis of coherent resonant x-ray scattering and reconstruction of magnetic domains
We have explored the use of coherent resonant x-ray scattering as a powerful technique to study, characterize and reconstruct magnetic domains for antiferromagnetic (AFM) and ferromagnetic (FM) thin films. This method is capable of high-resolution imaging (as it is not limited by optical aberrati...
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| Language: | English |
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2009
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| Online Access: | http://hdl.handle.net/2429/11798 |