Bayesian Accelerated Life Testing of Series Systems

Bayesian Accelerated Life Testing of Series Systems

Consider life testing of J-component series systems that are subjected to stress levels that are steeper than that at normal usage condition. The objective of performing such life tests, commonly known as Accelerated Life Testing (ALT) in the literature, is to collect observations on system failure...

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Bibliographic Details
Main Author: Roy, Soumya
Other Authors: Mukhopadhyay, Chiranjit
Language:en_US
Published: 2018
Subjects:
Series Systems
Bayesian Accelerated Life Testing
Lifetime Model
Exponential Component Lives
Weibull Component Lives
Maximum Likelihood Analysis
Long Normal Component Lives
J-Component Series Systems
System Reliability Testing
Bayesian Optimal Designs
K Stress Variables
Accelerated Life Testing (ALT)
System Life Testing
Variable Stress Accelerated Life Testing
Bayesian Analysis
Management
Online Access:http://hdl.handle.net/2005/3021
http://etd.ncsi.iisc.ernet.in/abstracts/3884/G27859-Abs.pdf

Internet

http://hdl.handle.net/2005/3021
http://etd.ncsi.iisc.ernet.in/abstracts/3884/G27859-Abs.pdf

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