Efficient Fault Tolerance In Chip Multiprocessors Using Critical Value Forwarding
Relentless CMOS scaling coupled with lower design tolerances is making ICs increasingly susceptible to transient faults, wear-out related permanent faults and process variations. Decreasing CMOS reliability implies that high-availability systems which were previously restricted to the domain of main...
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Language: | en_US |
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2013
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Online Access: | http://etd.iisc.ernet.in/handle/2005/2227 http://etd.ncsi.iisc.ernet.in/abstracts/2840/G24426-Abs.pdf |