Efficient Fault Tolerance In Chip Multiprocessors Using Critical Value Forwarding

Relentless CMOS scaling coupled with lower design tolerances is making ICs increasingly susceptible to transient faults, wear-out related permanent faults and process variations. Decreasing CMOS reliability implies that high-availability systems which were previously restricted to the domain of main...

Full description

Bibliographic Details
Main Author: Subramanyan, Pramod
Other Authors: Singh, Virendra
Language:en_US
Published: 2013
Subjects:
Online Access:http://etd.iisc.ernet.in/handle/2005/2227
http://etd.ncsi.iisc.ernet.in/abstracts/2840/G24426-Abs.pdf