Interference Enhanced Raman Spectroscopy Of Ultra Thin Crystalline Ge & Si Films And Their Interfaces
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| Language: | en_US |
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2012
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| Online Access: | http://etd.iisc.ernet.in/handle/2005/1763 http://etd.ncsi.iisc.ernet.in/abstracts/2289/G14904-Abs.pdf |