Microscopia de força atômica aplicada a sistemas eletroquímicos e biológicos de interesse

Atomic force microscopy (AFM) is a technique that is part of a series of scanning probe microscopies (SPM). It is a powerful tool due to its potential use in conducting, semiconducting and biological materials without the need of pretreatment of the samples, being applied in areas such as Chemistry...

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Bibliographic Details
Main Author: Silva Júnior, José Ginaldo da
Other Authors: Ribeiro, Adriana Santos
Language:Portuguese
Published: Universidade Federal de Alagoas 2018
Subjects:
Online Access:http://www.repositorio.ufal.br/handle/riufal/2513