Avalia??o de propriedades ?pticas e espessura de filmes finos de TiO2 a partir do espectro de transmit?ncia

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Bibliographic Details
Main Author: Severiano Sobrinho, Valmar da Silva
Other Authors: 46660640444
Language:Portuguese
Published: Universidade Federal do Rio Grande do Norte 2016
Subjects:
Online Access:http://repositorio.ufrn.br/handle/123456789/21301