Avalia??o de propriedades ?pticas e espessura de filmes finos de TiO2 a partir do espectro de transmit?ncia
Submitted by Automa??o e Estat?stica (sst@bczm.ufrn.br) on 2016-08-26T23:22:11Z No. of bitstreams: 1 ValmarDaSilvaSeverianoSobrinho_DISSERT.pdf: 5455840 bytes, checksum: 21030bd15bb16fb2597187481d68f757 (MD5) === Approved for entry into archive by Arlan Eloi Leite Silva (eloihistoriador@yahoo.com....
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Language: | Portuguese |
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Universidade Federal do Rio Grande do Norte
2016
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Online Access: | http://repositorio.ufrn.br/handle/123456789/21301 |