Investigating techniques to reduce soft error rate under single-event-induced charge sharing
The interaction of radiation with integrated circuits can provoke transient faults due to the deposit of charge in sensitive nodes of transistors. Because of the decrease the size in the process technology, charge sharing between transistors placed close to each other has been more and more observed...
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| Format: | Others |
| Language: | English |
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2017
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| Online Access: | http://hdl.handle.net/10183/169238 |