Estudo de orientacoes cristalograficas de acos ao silicio utilizando tecnicas de difracao de raios X, difracao de eletrons e metodo ETCH PIT

Estudo de orientacoes cristalograficas de acos ao silicio utilizando tecnicas de difracao de raios X, difracao de eletrons e metodo ETCH PIT

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Bibliographic Details
Main Author: SANTOS, HAMILTA de O.
Other Authors: Orientador: Waldemar Alfredo Monteiro
Format: Others
Published: 1999
Subjects:
iron
silicon
steels
electrical properties
grain size
grain orientation
microstructure
crystallography
scanning electron microscopy
x-ray diffraction
electron diffraction
Online Access:http://repositorio.ipen.br:8080/xmlui/handle/123456789/10783

Internet

http://repositorio.ipen.br:8080/xmlui/handle/123456789/10783

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