Aplicações do método Warren-Averbach de análise de perfis de difração

Aplicações do método Warren-Averbach de análise de perfis de difração

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Made available in DSpace on 2014-10-09T12:42:15Z (GMT). No. of bitstreams: 0 === Made available in DSpace on 2014-10-09T14:05:30Z (GMT). No. of bitstreams: 0 === Dissertação (Mestrado) === IPEN/D === Instituto de Pesquisas Energeticas e Nucleares - IPEN-CNEN/SP

Bibliographic Details
Main Author: ICHIKAWA, RODRIGO U.
Other Authors: Orientador: Luis Gallego Martinez
Format: Others
Published: 2013
Subjects:
CRYSTALLOGRAPHY
FOURIER ANALYSIS
CHEMICAL ANALYSIS
X-RAY DIFFRACTION
MICROSTRUCTURE
ZIRCALOY
YTRIUM OXIDES
ZINC OXIDES
COMPUTER CODES
Online Access:http://repositorio.ipen.br:8080/xmlui/handle/123456789/10585
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spelling ndltd-IBICT-oai-10.40.40.102-123456789-105852018-05-23T21:36:08Z Aplicações do método Warren-Averbach de análise de perfis de difração Applications of the Warren-Averbach method of X-ray diffraction line profile analysis ICHIKAWA, RODRIGO U. Orientador: Luis Gallego Martinez CRYSTALLOGRAPHY FOURIER ANALYSIS CHEMICAL ANALYSIS X-RAY DIFFRACTION MICROSTRUCTURE ZIRCALOY YTRIUM OXIDES ZINC OXIDES COMPUTER CODES Made available in DSpace on 2014-10-09T12:42:15Z (GMT). No. of bitstreams: 0 Made available in DSpace on 2014-10-09T14:05:30Z (GMT). No. of bitstreams: 0 Dissertação (Mestrado) IPEN/D Instituto de Pesquisas Energeticas e Nucleares - IPEN-CNEN/SP 2013 2014-10-09T12:42:15Z 2014-10-09T14:05:30Z 2014-10-09T12:42:15Z 2014-10-09T14:05:30Z info:eu-repo/semantics/publishedVersion info:eu-repo/semantics/masterThesis http://repositorio.ipen.br:8080/xmlui/handle/123456789/10585 info:eu-repo/semantics/openAccess 94 N reponame:Repositório Institucional do IPEN instname:Instituto de Pesquisas Energéticas e Nucleares instacron:IPEN
collection NDLTD
format Others
sources NDLTD
topic CRYSTALLOGRAPHY
FOURIER ANALYSIS
CHEMICAL ANALYSIS
X-RAY DIFFRACTION
MICROSTRUCTURE
ZIRCALOY
YTRIUM OXIDES
ZINC OXIDES
COMPUTER CODES
spellingShingle CRYSTALLOGRAPHY
FOURIER ANALYSIS
CHEMICAL ANALYSIS
X-RAY DIFFRACTION
MICROSTRUCTURE
ZIRCALOY
YTRIUM OXIDES
ZINC OXIDES
COMPUTER CODES
ICHIKAWA, RODRIGO U.
Aplicações do método Warren-Averbach de análise de perfis de difração
description Made available in DSpace on 2014-10-09T12:42:15Z (GMT). No. of bitstreams: 0 === Made available in DSpace on 2014-10-09T14:05:30Z (GMT). No. of bitstreams: 0 === Dissertação (Mestrado) === IPEN/D === Instituto de Pesquisas Energeticas e Nucleares - IPEN-CNEN/SP
author2 Orientador: Luis Gallego Martinez
author_facet Orientador: Luis Gallego Martinez
ICHIKAWA, RODRIGO U.
author ICHIKAWA, RODRIGO U.
author_sort ICHIKAWA, RODRIGO U.
title Aplicações do método Warren-Averbach de análise de perfis de difração
title_short Aplicações do método Warren-Averbach de análise de perfis de difração
title_full Aplicações do método Warren-Averbach de análise de perfis de difração
title_fullStr Aplicações do método Warren-Averbach de análise de perfis de difração
title_full_unstemmed Aplicações do método Warren-Averbach de análise de perfis de difração
title_sort aplicações do método warren-averbach de análise de perfis de difração
publishDate 2013
url http://repositorio.ipen.br:8080/xmlui/handle/123456789/10585
work_keys_str_mv AT ichikawarodrigou aplicacoesdometodowarrenaverbachdeanalisedeperfisdedifracao
AT ichikawarodrigou applicationsofthewarrenaverbachmethodofxraydiffractionlineprofileanalysis
_version_ 1718664773305892864

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