Aplicações do método Warren-Averbach de análise de perfis de difração

Aplicações do método Warren-Averbach de análise de perfis de difração

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Made available in DSpace on 2014-10-09T12:42:15Z (GMT). No. of bitstreams: 0 === Made available in DSpace on 2014-10-09T14:05:30Z (GMT). No. of bitstreams: 0 === Dissertação (Mestrado) === IPEN/D === Instituto de Pesquisas Energeticas e Nucleares - IPEN-CNEN/SP

Bibliographic Details
Main Author: ICHIKAWA, RODRIGO U.
Other Authors: Orientador: Luis Gallego Martinez
Format: Others
Published: 2013
Subjects:
CRYSTALLOGRAPHY
FOURIER ANALYSIS
CHEMICAL ANALYSIS
X-RAY DIFFRACTION
MICROSTRUCTURE
ZIRCALOY
YTRIUM OXIDES
ZINC OXIDES
COMPUTER CODES
Online Access:http://repositorio.ipen.br:8080/xmlui/handle/123456789/10585

Internet

http://repositorio.ipen.br:8080/xmlui/handle/123456789/10585

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