$Strain-related phenomena in (In,Ga)N/GaN nanowires and rods investigated by nanofocus x-ray diffraction and the finite element method$

Strain-related phenomena in (In,Ga)N/GaN nanowires and rods investigated by nanofocus x-ray diffraction and the finite element method

In dieser Arbeit wird das lokal aufgelöste Deformationsfeld einzelner (In,Ga)N/GaN Drähte mit Hilfe nanofokussierter Röntgenbeugung und der Methode der Finiten Elemente untersucht. Hiermit soll ein Beitrag zum grundlegenden Verständis der optischen Eigenschaften geleistet werden, die durch das D...

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Bibliographic Details
Main Author:	Henkel, Thilo Johannes
Other Authors:	Riechert, Henning
Format:	Doctoral Thesis
Language:	English
Published:	Humboldt-Universität zu Berlin 2018
Subjects:	(In,Ga)N/GaN Nanodrähte Beugung mit fokussierter Röntgenstrahlung Finite Elemente Methode Streusimulation (In,Ga)N/GaN nanowires nanofocus x-ray diffraction finite element method kinematic scattering simulation 530 Physik UP 3150 ddc:530
Online Access:	http://edoc.hu-berlin.de/18452/19418 http://nbn-resolving.de/urn:nbn:de:kobv:11-110-18452/19418-5 http://dx.doi.org/10.18452/18707

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