Characterization of residual stresses in birefringent materials applied to multicrystalline silicon wafers
Birefringence has been used to study transparent materials since 1815, and is based on the decomposition of a polarized ray of light into two distinct rays when passing through an optically anisotropic material. This thesis uses this phenomenon in a study of phase retardation in crystalline material...
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Georgia Institute of Technology
2015
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| Online Access: | http://hdl.handle.net/1853/53050 |