Modeling, design, fabrication and characterization of glass package-to-PCB interconnections
Emerging I/O density and bandwidth requirements are driving packages to low-CTE silicon, glass and organic substrates for higher wiring density and reliability of interconnections and Cu-low k dielectrics. These are needed for high performance applications as 2.5D packages in large-size, and also as...
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Format: | Others |
Language: | en_US |
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Georgia Institute of Technology
2014
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Online Access: | http://hdl.handle.net/1853/51781 |