Low-cost testing of high-precision analog-to-digital converters
The advent of deep submicron technology has resulted in a new generation of highly integrated mixed-signal system-on-chips (SoCs) and system-on-packages (SoPs). As a result, the cost of electrical products has sharply declined, and their performance has greatly improved. However, a testing throughpu...
| Main Author: | |
|---|---|
| Published: |
Georgia Institute of Technology
2011
|
| Subjects: | |
| Online Access: | http://hdl.handle.net/1853/41170 |