Precision lattice parameter measurements using a standard double axis x-ray diffractometer

Precision lattice parameter measurements using a standard double axis x-ray diffractometer

Bibliographic Details
Main Author: Davidson, Mark A.
Published: Georgia Institute of Technology 2008
Subjects:
X-ray diffractometer
Crystal growth
Online Access:http://hdl.handle.net/1853/19993
id ndltd-GATECH-oai-smartech.gatech.edu-1853-19993
record_format oai_dc
spelling ndltd-GATECH-oai-smartech.gatech.edu-1853-199932013-12-15T03:37:47ZPrecision lattice parameter measurements using a standard double axis x-ray diffractometerDavidson, Mark A.X-ray diffractometerCrystal growthGeorgia Institute of Technology2008-02-21T12:32:27Z2008-02-21T12:32:27Z1998-05Thesishttp://hdl.handle.net/1853/19993466275Access restricted to authorized Georgia Tech users only.
collection NDLTD
sources NDLTD
topic X-ray diffractometer
Crystal growth
spellingShingle X-ray diffractometer
Crystal growth
Davidson, Mark A.
Precision lattice parameter measurements using a standard double axis x-ray diffractometer
author Davidson, Mark A.
author_facet Davidson, Mark A.
author_sort Davidson, Mark A.
title Precision lattice parameter measurements using a standard double axis x-ray diffractometer
title_short Precision lattice parameter measurements using a standard double axis x-ray diffractometer
title_full Precision lattice parameter measurements using a standard double axis x-ray diffractometer
title_fullStr Precision lattice parameter measurements using a standard double axis x-ray diffractometer
title_full_unstemmed Precision lattice parameter measurements using a standard double axis x-ray diffractometer
title_sort precision lattice parameter measurements using a standard double axis x-ray diffractometer
publisher Georgia Institute of Technology
publishDate 2008
url http://hdl.handle.net/1853/19993
work_keys_str_mv AT davidsonmarka precisionlatticeparametermeasurementsusingastandarddoubleaxisxraydiffractometer
_version_ 1716618664445214720

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