Precision lattice parameter measurements using a standard double axis x-ray diffractometer

Precision lattice parameter measurements using a standard double axis x-ray diffractometer

Bibliographic Details
Main Author: Davidson, Mark A.
Published: Georgia Institute of Technology 2008
Subjects:
X-ray diffractometer
Crystal growth
Online Access:http://hdl.handle.net/1853/19993

Internet

http://hdl.handle.net/1853/19993

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