Physics-based modeling methodology for reliability of microvias
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Georgia Institute of Technology
2007
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ndltd-GATECH-oai-smartech.gatech.edu-1853-188432013-12-15T03:36:53ZPhysics-based modeling methodology for reliability of microviasRamakrishna, GnyaneshwarIntegrated circuits Design and constructionMicroelectronic packaging MaterialsGeorgia Institute of Technology2007-12-20T12:30:37Z2007-12-20T12:30:37Z2002-08Thesishttp://hdl.handle.net/1853/18843663086Access restricted to authorized Georgia Tech users only. |
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topic |
Integrated circuits Design and construction Microelectronic packaging Materials |
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Integrated circuits Design and construction Microelectronic packaging Materials Ramakrishna, Gnyaneshwar Physics-based modeling methodology for reliability of microvias |
author |
Ramakrishna, Gnyaneshwar |
author_facet |
Ramakrishna, Gnyaneshwar |
author_sort |
Ramakrishna, Gnyaneshwar |
title |
Physics-based modeling methodology for reliability of microvias |
title_short |
Physics-based modeling methodology for reliability of microvias |
title_full |
Physics-based modeling methodology for reliability of microvias |
title_fullStr |
Physics-based modeling methodology for reliability of microvias |
title_full_unstemmed |
Physics-based modeling methodology for reliability of microvias |
title_sort |
physics-based modeling methodology for reliability of microvias |
publisher |
Georgia Institute of Technology |
publishDate |
2007 |
url |
http://hdl.handle.net/1853/18843 |
work_keys_str_mv |
AT ramakrishnagnyaneshwar physicsbasedmodelingmethodologyforreliabilityofmicrovias |
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1716618435185606656 |