Physics-based modeling methodology for reliability of microvias

Bibliographic Details
Main Author: Ramakrishna, Gnyaneshwar
Published: Georgia Institute of Technology 2007
Subjects:
Online Access:http://hdl.handle.net/1853/18843
id ndltd-GATECH-oai-smartech.gatech.edu-1853-18843
record_format oai_dc
spelling ndltd-GATECH-oai-smartech.gatech.edu-1853-188432013-12-15T03:36:53ZPhysics-based modeling methodology for reliability of microviasRamakrishna, GnyaneshwarIntegrated circuits Design and constructionMicroelectronic packaging MaterialsGeorgia Institute of Technology2007-12-20T12:30:37Z2007-12-20T12:30:37Z2002-08Thesishttp://hdl.handle.net/1853/18843663086Access restricted to authorized Georgia Tech users only.
collection NDLTD
sources NDLTD
topic Integrated circuits Design and construction
Microelectronic packaging Materials
spellingShingle Integrated circuits Design and construction
Microelectronic packaging Materials
Ramakrishna, Gnyaneshwar
Physics-based modeling methodology for reliability of microvias
author Ramakrishna, Gnyaneshwar
author_facet Ramakrishna, Gnyaneshwar
author_sort Ramakrishna, Gnyaneshwar
title Physics-based modeling methodology for reliability of microvias
title_short Physics-based modeling methodology for reliability of microvias
title_full Physics-based modeling methodology for reliability of microvias
title_fullStr Physics-based modeling methodology for reliability of microvias
title_full_unstemmed Physics-based modeling methodology for reliability of microvias
title_sort physics-based modeling methodology for reliability of microvias
publisher Georgia Institute of Technology
publishDate 2007
url http://hdl.handle.net/1853/18843
work_keys_str_mv AT ramakrishnagnyaneshwar physicsbasedmodelingmethodologyforreliabilityofmicrovias
_version_ 1716618435185606656