Design for testability techniques and optimization algorithms for performance and functional testing of mult-chip module interconnections

Design for testability techniques and optimization algorithms for performance and functional testing of mult-chip module interconnections

Bibliographic Details
Main Author:	Pendurkar, Rajesh
Published:	Georgia Institute of Technology 2007
Subjects:	Multichip modules (Microelectronics) Testing
Online Access:	http://hdl.handle.net/1853/16635

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