Predictive statistical analysis of embedded meander resistors via measurement of canonical building blocks

Predictive statistical analysis of embedded meander resistors via measurement of canonical building blocks

Bibliographic Details
Main Author: Carastro, Lawrence A.
Published: Georgia Institute of Technology 2007
Subjects:
Electronic packaging
Integrated circuits Passivation
Analog-to-digital converters
Online Access:http://hdl.handle.net/1853/15482

Internet

http://hdl.handle.net/1853/15482

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