DESIGN-FOR-TESTABILITY AND DIAGNOSIS METHODS TO TARGET UNMODELED DEFECTS IN INTEGRATED CIRCUITS AND MULTI-CHIP BOARDS
<p>Very deep sub-micron process technologies are leading to increasing defect rates for integrated circuits (ICs) and multi-chip boards. To ensure the quality of test patterns and more effective defect screening, functional tests, delay tests, and n-detect tests are commonly used in industry f...
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2011
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| Online Access: | http://hdl.handle.net/10161/3910 |