SAMs (self-assembled monolayers) passivation of cobalt microbumps for 3D stacking of Si chips
In this paper SAM (self-assembled monolayers) is used to passivate cobalt microbumps for 3D-stacking of Si chips. The SAM deposition process is optimized, using input from characterization techniques such as water contact angle measurement, ATR, AFM and XPS analysis in order to form a monolayer of T...
Main Authors: | , , , , , , , , |
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Other Authors: | |
Format: | Others |
Language: | English |
Published: |
Universitätsbibliothek Chemnitz
2016
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Subjects: | |
Online Access: | http://nbn-resolving.de/urn:nbn:de:bsz:ch1-qucosa-207172 http://nbn-resolving.de/urn:nbn:de:bsz:ch1-qucosa-207172 http://www.qucosa.de/fileadmin/data/qucosa/documents/20717/Hou_SAMs_%28self-assembled%20monolayers%29_passivation_of_cobalt_microbumps_for_3D_stacking_of_Si_chips.pdf http://www.qucosa.de/fileadmin/data/qucosa/documents/20717/signatur.txt.asc |
Internet
http://nbn-resolving.de/urn:nbn:de:bsz:ch1-qucosa-207172http://nbn-resolving.de/urn:nbn:de:bsz:ch1-qucosa-207172
http://www.qucosa.de/fileadmin/data/qucosa/documents/20717/Hou_SAMs_%28self-assembled%20monolayers%29_passivation_of_cobalt_microbumps_for_3D_stacking_of_Si_chips.pdf
http://www.qucosa.de/fileadmin/data/qucosa/documents/20717/signatur.txt.asc