Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) 18 O-tracer investigations on interface diffusion in Y 2 O 3 /YSZ multilayer systems

Bibliographic Details
Main Authors:	Steinmüller, Sven Ole, Aydin, Halit, Rein, Alexander, Korte, Carsten
Other Authors:	Justus-Liebig-Universität Gießen, Physikalisch-Chemisches Institut
Format:	Article
Language:	English
Published:	Universitätsbibliothek Leipzig 2015
Subjects:	Diffusion Transport diffusion transport ddc:530
Online Access:	http://nbn-resolving.de/urn:nbn:de:bsz:15-qucosa-186982 http://nbn-resolving.de/urn:nbn:de:bsz:15-qucosa-186982 http://www.qucosa.de/fileadmin/data/qucosa/documents/18698/diff_fund_12%282010%2955.pdf

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spelling	ndltd-DRESDEN-oai-qucosa.de-bsz-15-qucosa-1869822015-11-11T03:26:56Z Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) 18 O-tracer investigations on interface diffusion in Y 2 O 3 /YSZ multilayer systems Steinmüller, Sven Ole Aydin, Halit Rein, Alexander Korte, Carsten Diffusion Transport diffusion transport ddc:530 Universitätsbibliothek Leipzig Justus-Liebig-Universität Gießen, Physikalisch-Chemisches Institut Universität Leipzig, Fakultät für Physik und Geowissenschaften 2015-11-05 doc-type:article application/pdf http://nbn-resolving.de/urn:nbn:de:bsz:15-qucosa-186982 urn:nbn:de:bsz:15-qucosa-186982 issn:1862-4138 http://www.qucosa.de/fileadmin/data/qucosa/documents/18698/diff_fund_12%282010%2955.pdf Diffusion fundamentals 12 (2010) 55 eng
collection	NDLTD
language	English
format	Article
sources	NDLTD
topic	Diffusion Transport diffusion transport ddc:530
spellingShingle	Diffusion Transport diffusion transport ddc:530 Steinmüller, Sven Ole Aydin, Halit Rein, Alexander Korte, Carsten Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) 18 O-tracer investigations on interface diffusion in Y 2 O 3 /YSZ multilayer systems
author2	Justus-Liebig-Universität Gießen, Physikalisch-Chemisches Institut
author_facet	Justus-Liebig-Universität Gießen, Physikalisch-Chemisches Institut Steinmüller, Sven Ole Aydin, Halit Rein, Alexander Korte, Carsten
author	Steinmüller, Sven Ole Aydin, Halit Rein, Alexander Korte, Carsten
author_sort	Steinmüller, Sven Ole
title	Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) 18 O-tracer investigations on interface diffusion in Y 2 O 3 /YSZ multilayer systems
title_short	Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) 18 O-tracer investigations on interface diffusion in Y 2 O 3 /YSZ multilayer systems
title_full	Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) 18 O-tracer investigations on interface diffusion in Y 2 O 3 /YSZ multilayer systems
title_fullStr	Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) 18 O-tracer investigations on interface diffusion in Y 2 O 3 /YSZ multilayer systems
title_full_unstemmed	Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) 18 O-tracer investigations on interface diffusion in Y 2 O 3 /YSZ multilayer systems
title_sort	time-of-flight secondary ion mass spectrometry (tof-sims) 18 o-tracer investigations on interface diffusion in y 2 o 3 /ysz multilayer systems
publisher	Universitätsbibliothek Leipzig
publishDate	2015
url	http://nbn-resolving.de/urn:nbn:de:bsz:15-qucosa-186982 http://nbn-resolving.de/urn:nbn:de:bsz:15-qucosa-186982 http://www.qucosa.de/fileadmin/data/qucosa/documents/18698/diff_fund_12%282010%2955.pdf
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Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) 18 O-tracer investigations on interface diffusion in Y 2 O 3 /YSZ multilayer systems

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