Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) 18 O-tracer investigations on interface diffusion in Y 2 O 3 /YSZ multilayer systems

Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) 18 O-tracer investigations on interface diffusion in Y 2 O 3 /YSZ multilayer systems

Bibliographic Details
Main Authors: Steinmüller, Sven Ole, Aydin, Halit, Rein, Alexander, Korte, Carsten
Other Authors: Justus-Liebig-Universität Gießen, Physikalisch-Chemisches Institut
Format: Article
Language:English
Published: Universitätsbibliothek Leipzig 2015
Subjects:
Diffusion
Transport
diffusion
transport
ddc:530
Online Access:http://nbn-resolving.de/urn:nbn:de:bsz:15-qucosa-186982
http://nbn-resolving.de/urn:nbn:de:bsz:15-qucosa-186982
http://www.qucosa.de/fileadmin/data/qucosa/documents/18698/diff_fund_12%282010%2955.pdf

Internet

http://nbn-resolving.de/urn:nbn:de:bsz:15-qucosa-186982
http://nbn-resolving.de/urn:nbn:de:bsz:15-qucosa-186982
http://www.qucosa.de/fileadmin/data/qucosa/documents/18698/diff_fund_12%282010%2955.pdf

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