Limitations of the Pulse-Shape Technique for Particle Discrimination in Planar Si Detectors

Limitations of the Pulse-Shape Technique for Particle Discrimination in Planar Si Detectors

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Limitations of the pulse-shape discrimination (PSD) technique - a promising method to identify the charged particIes stopped in planar Si-detectors - have been investigated. The particle resolution turned out to be basically determined by resistivity fluctuations in the buk silicon which cause the c...

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Bibliographic Details
Main Authors: Wolski, D., Cederkäll, J., Pausch, G., Moszynski, M., Schubart, R., Rohr, P., Lampert, M.-O., Grawe, H., Klamra, W., Seidel, W.
Language:English
Published: Forschungszentrum Rossendorf 2010
Online Access:http://nbn-resolving.de/urn:nbn:de:bsz:d120-qucosa-31373
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http://nbn-resolving.de/urn:nbn:de:bsz:d120-qucosa-31373
https://hzdr.qucosa.de/id/qucosa%3A21964
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