"Analogue Network of Converters": a DfT Technique to Test a Complete Set of ADCs and DACs Embedded in a Complex SiP or SoC

"Analogue Network of Converters": a DfT Technique to Test a Complete Set of ADCs and DACs Embedded in a Complex SiP or SoC

Une nouvelle méthode de test pour les convertisseurs ADC et DAC embarqués dans un système complexe a été développée en prenant en compte les nouvelles contraintes affectant le test. Ces contraintes, dues aux tendances de design de systèmes, sont un nombre réduit de point d'accès aux entrées/sor...

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Bibliographic Details
Main Author:	Kerzerho, Vincent
Language:	fra
Published:	Université Montpellier II - Sciences et Techniques du Languedoc 2008
Subjects:	[SPI] Engineering Sciences [SPI] Sciences de l'ingénieur Test analog to digital converter (ADC) digital to analog converter (DAC) system-inpackage (SiP) analog network of converters (ANC) dynamic parameters total harmonic distortion (THD) spurious free dynamic range ( SFDR)
Online Access:	http://tel.archives-ouvertes.fr/tel-00364546 http://tel.archives-ouvertes.fr/docs/00/36/45/46/PDF/2009_02_09_these_VK_version_imprimable_.pdf

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