Scanning tunneling microscopy and spectroscopy : I. Semimetals and semiconductors. II. Atom-resolved imaging of DNA

Scanning tunneling microscopy and spectroscopy : I. Semimetals and semiconductors. II. Atom-resolved imaging of DNA

<p>The topographic and electronic structure of semiconductor and semimetal surfaces were investigated using scanning tunneling microscopy (STM) and scanning tunneling spectroscopy (STS), respectively. The longrange morphology and atomic-scale characteristics of cleaved materials such as highly...

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Bibliographic Details
Main Author: Driscoll, Robert James
Format: Others
Language:en
Published: 1993
Online Access:https://thesis.library.caltech.edu/7294/1/Driscoll_rj_1993.pdf
Driscoll, Robert James (1993) Scanning tunneling microscopy and spectroscopy : I. Semimetals and semiconductors. II. Atom-resolved imaging of DNA. Dissertation (Ph.D.), California Institute of Technology. doi:10.7907/fp55-ng98. https://resolver.caltech.edu/CaltechTHESIS:11292012-090633873 <https://resolver.caltech.edu/CaltechTHESIS:11292012-090633873>

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https://thesis.library.caltech.edu/7294/1/Driscoll_rj_1993.pdf
Driscoll, Robert James (1993) Scanning tunneling microscopy and spectroscopy : I. Semimetals and semiconductors. II. Atom-resolved imaging of DNA. Dissertation (Ph.D.), California Institute of Technology. doi:10.7907/fp55-ng98. https://resolver.caltech.edu/CaltechTHESIS:11292012-090633873 <https://resolver.caltech.edu/CaltechTHESIS:11292012-090633873>

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