Scanning Tunneling Microscopy and Spectroscopy of Silicon and Carbon Surfaces

Scanning Tunneling Microscopy and Spectroscopy of Silicon and Carbon Surfaces

<p>Scanning Tunneling Microscopy (STM) investigations and additional surface analyses were performed on carbon and silicon surfaces. A number of anomalies have been observed on highly oriented pyrolytic graphite (HOPG), including large corrugations, distorted images, large range of tip motion...

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Bibliographic Details
Main Author: Baker, Shenda Mary
Format: Others
Published: 1992
Online Access:https://thesis.library.caltech.edu/6644/1/Baker_sm_1992.pdf
Baker, Shenda Mary (1992) Scanning Tunneling Microscopy and Spectroscopy of Silicon and Carbon Surfaces. Dissertation (Ph.D.), California Institute of Technology. doi:10.7907/5JGQ-4X60. https://resolver.caltech.edu/CaltechTHESIS:09012011-151648229 <https://resolver.caltech.edu/CaltechTHESIS:09012011-151648229>

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https://thesis.library.caltech.edu/6644/1/Baker_sm_1992.pdf
Baker, Shenda Mary (1992) Scanning Tunneling Microscopy and Spectroscopy of Silicon and Carbon Surfaces. Dissertation (Ph.D.), California Institute of Technology. doi:10.7907/5JGQ-4X60. https://resolver.caltech.edu/CaltechTHESIS:09012011-151648229 <https://resolver.caltech.edu/CaltechTHESIS:09012011-151648229>

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