Temperature-dependent extended electron energy loss fine structure measurements from K, L23, and M45 edges in metals, intermetallic alloys, and nanocrystalline materials

Temperature-dependent extended electron energy loss fine structure measurements from K, L23, and M45 edges in metals, intermetallic alloys, and nanocrystalline materials

This dissertation developed the extended energy loss fine structure (EXELFS) technique. EXELFS experiments using the Al K, Fe L23 and Pd M45 edges in the elemental metals gave nearest-neighbor distances which were accurate to within ± 0.1 A. In addition, vibrational mean-square relative displacement...

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Bibliographic Details
Main Author: Okamoto, James Kozo
Format: Others
Language:en
Published: 1993
Online Access:https://thesis.library.caltech.edu/4941/1/Okamoto_jk_1993.pdf
Okamoto, James Kozo (1993) Temperature-dependent extended electron energy loss fine structure measurements from K, L23, and M45 edges in metals, intermetallic alloys, and nanocrystalline materials. Dissertation (Ph.D.), California Institute of Technology. doi:10.7907/kk1d-wm17. https://resolver.caltech.edu/CaltechETD:etd-12112006-073855 <https://resolver.caltech.edu/CaltechETD:etd-12112006-073855>

Internet

https://thesis.library.caltech.edu/4941/1/Okamoto_jk_1993.pdf
Okamoto, James Kozo (1993) Temperature-dependent extended electron energy loss fine structure measurements from K, L23, and M45 edges in metals, intermetallic alloys, and nanocrystalline materials. Dissertation (Ph.D.), California Institute of Technology. doi:10.7907/kk1d-wm17. https://resolver.caltech.edu/CaltechETD:etd-12112006-073855 <https://resolver.caltech.edu/CaltechETD:etd-12112006-073855>

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