Quantitative Biaxial Texture Analysis with Reflection High-Energy Electron Diffraction for Ion Beam-Assisted Deposition of MgO and Heteroepitaxy of Perovskite Ferroelectrics
<p>To facilitate ferroelectric-based actuator integration with silicon electronics fabrication technology, we have developed a route to produce biaxially textured ferroelectrics on amorphous layers by using biaxially textured MgO templates.</p> <p>Using a kinematical electron sc...
Internet
https://thesis.library.caltech.edu/3160/1/ThesisFinalDefended.pdfBrewer, Rhett Ty (2004) Quantitative Biaxial Texture Analysis with Reflection High-Energy Electron Diffraction for Ion Beam-Assisted Deposition of MgO and Heteroepitaxy of Perovskite Ferroelectrics. Dissertation (Ph.D.), California Institute of Technology. doi:10.7907/J5PY-RS79. https://resolver.caltech.edu/CaltechETD:etd-08182003-150957 <https://resolver.caltech.edu/CaltechETD:etd-08182003-150957>