Specific DNA Restriction Fragments as Internal Markers in the Electron Microscope: Superimposing the ɸX174 Genetic Map on ɸX174/S13 DNA Heteroduplexes

Specific DNA Restriction Fragments as Internal Markers in the Electron Microscope: Superimposing the ɸX174 Genetic Map on ɸX174/S13 DNA Heteroduplexes

<p>Chapter I</p> <p>ɸX174 RF II* molecules were constructed in vitro by annealing circular ɸX174 viral DNA and linear ɸX174 complementary strand DNA. When a specific fragment of ɸX174 RF purified from a digestion with the restriction endonuclease Hind from Hemophilus influenzae...

Full description

Bibliographic Details
Main Author: Compton, John Lee
Format: Others
Language:en
Published: 1975
Online Access:https://thesis.library.caltech.edu/14363/1/Compton_JL_1975.pdf
Compton, John Lee (1975) Specific DNA Restriction Fragments as Internal Markers in the Electron Microscope: Superimposing the ɸX174 Genetic Map on ɸX174/S13 DNA Heteroduplexes. Dissertation (Ph.D.), California Institute of Technology. doi:10.7907/nr2r-8c58. https://resolver.caltech.edu/CaltechTHESIS:09152021-165317789 <https://resolver.caltech.edu/CaltechTHESIS:09152021-165317789>

Internet

https://thesis.library.caltech.edu/14363/1/Compton_JL_1975.pdf
Compton, John Lee (1975) Specific DNA Restriction Fragments as Internal Markers in the Electron Microscope: Superimposing the ɸX174 Genetic Map on ɸX174/S13 DNA Heteroduplexes. Dissertation (Ph.D.), California Institute of Technology. doi:10.7907/nr2r-8c58. https://resolver.caltech.edu/CaltechTHESIS:09152021-165317789 <https://resolver.caltech.edu/CaltechTHESIS:09152021-165317789>

Similar Items